GW Electronics Type 43 Infrared Chamberscope JEOL JSM-6300/6400F Working Surplus Part No: 696-6004

Part No: 696-6004

img{max-width:100%} Omron Z4LC-C28 Parallel Beam Line Sensor NSR-S307E DUV Scanning System As-Is

Estimated Packed Shipping Dimensions: L x W x H = 12"x12"x12" @ 8 lbs

INSERT CHAMBER SLIT VALVE This AMAT Applied Materials 0200-40091 Insert Quartz Mark IV Chamber Slit is new surplus

Part No: #0176

GW Electronics Type 43 Infrared Chamberscope JEOL JSM-6300/6400F Working Surplus Part No: 696-6004GW Electronics Type 43 Infrared Chamberscope JEOL JSM 6300 6400F Working Surplus Inventory # 21122 Part No: Type 43 For use with the JEOL JSM 6300 6400F SEM Scanning Electron Microscope System This GW Electronics Type 43 Infrared Chamberscope is used working surplus. The physical condition is good, but there are signs of previous use and handling. Sale Details Item Condition: Used Working, 90 Day Warranty Estimated Packed Shipping Dimensions: L x W x